cross section of an electron microscope
Electron microscope: it uses an electron beam (as opposed to light) to provide magnification that is markedly superior to that of an optical microscope.
Adjustable metal plate (stage) on which the specimen is mounted in order to study it.
Device with an opening whose diameter can be changed to narrow or widen the diameter of the electron beam.
Device that adjusts the diaphragm opening in order to change the diameter of the beam.
System of magnetic lenses (electromagnets producing a magnetic field when excited by an electric current) that concentrates the beam onto the specimen under study.
Conduit connected to a pump that creates enough of a vacuum in the microscope that it can function.
Device that usually consists of a tungsten filament that is heated to produce an intense electron beam, which illuminates the specimen.
Part of the microscope in which pressure can be reduced so that the electrons can move.
The electron beam explores the surface of the specimen, which in turn emits electrons to form a point-by-point image on the screen.
System of magnetic lenses (electromagnets) that concentrate the electron beam on one spot on the specimen.
beam diameter reduction
The two lenses of the condenser cause the divergent electron beam emitted by the gun to converge.
electron beam positioning
Control that positions the electron beam along the optical axis so that it reaches the specimen.
Set of negatively charged particles that propagate toward the specimen.